Test of Time Award

The ACM SIGCSE Test of Time Award recognizes an outstanding paper published in the SIGCSE community that has had meaningful impact on computing education practice and research. The nomination information is available online. The application deadline for the award is September 1 of every year. This award was initiated in 2020.

In addition, the SIGCSE Board recognized the Top 10 Symposium Papers of all time at the 50th SIGCSE Technical Symposium in 2019. Information about this award and award winners can be found on the ACM SIGCSE Top Ten Symposium Papers of All Time Award page on this website.

Below is the list of the SIGCSE Test of Time Award winners.

2024: Evaluating a new exam question: Parsons problems

Paul Denny, Andrew Luxton-Reilly, and Beth Simon. 2008. Evaluating a new exam question: Parsons problems. In Proceedings of the Fourth international Workshop on Computing Education Research (ICER ‘08). Association for Computing Machinery, New York, NY, USA, 113–124. DOI: https://doi.org/10.1145/1404520.1404532

2022: Connecting K-16 Curriculum & Policy: Making Computer Science Engaging, Accessible, and Hospitable for Underrepresented Students

Joanna Goode. 2010. Connecting K-16 Curriculum & Policy: Making Computer Science Engaging, Accessible, and Hospitable for Underrepresented Students. In Proceedings of the 41st ACM technical symposium on Computer science education (SIGCSE ‘10). Association for Computing Machinery, New York, NY, USA, 22–26. DOI: https://doi.org/10.1145/1734263.1734272

2021: The incredible shrinking pipeline

Tracy Camp. 1997. The incredible shrinking pipeline. Commun. ACM 40, 10 (Oct. 1997), 103–110. DOI: https://doi.org/10.1145/262793.262813

2020: An object-oriented program development environment for the first programming course

Michael Kölling and John Rosenberg. 1996. An object-oriented program development environment for the first programming course. In Proceedings of the twenty-seventh SIGCSE technical symposium on Computer science education (SIGCSE ‘96), Karl J. Klee (Ed.). ACM, New York, NY, USA, 83-87. DOI: https://doi.org/10.1145/236452.236514